The automatic dielectric loss and dielectric constant tester consists of a high-frequency impedance analyzer, a test fixture, and standard dielectric samples. It is used to measure the dielectric constant (ε) and dissipation factor (D or tanδ) of insulating materials under both low and high frequencies.
It complies with international and national standards:
GB/T 1409-2006 (China)
ASTM D150 (USA)
IEC 60250 (International)
The system supports frequency ranges of 20 Hz – 1 MHz / 2 MHz / 5 MHz (optional), enabling precise characterization of the dielectric constant (ε) and dissipation factor (D or tanδ) over a wide spectrum.
The test fixture adopts a parallel-plate capacitor structure, which clamps the sample material. By using a high-frequency impedance analyzer, dielectric constant and loss values are obtained directly without manual calculation.
Direct measurement of dielectric constant and dissipation factor, no manual calculation required.
Resistance measurement capability.
4.3-inch TFT LCD display with English/Chinese interface.
Maximum test frequency up to 5 MHz.
Integrated balance testing function.
Transformer parameter testing function.
High-speed measurement: 13 ms/time.
Automatic level control (ALC) of voltage/current.
V/I signal monitoring function.
Built-in DC bias source, optional external high-current DC bias source.
List scanning test with 10 points.
Selectable internal resistance: 30Ω, 50Ω, 100Ω.
Built-in comparator with 10-bin sorting and counting.
Data storage to internal memory or USB drive.
Multiple interfaces: RS232C, USB, LAN, HANDLER, GPIB (optional).
High precision: Cp resolution 0.00001 pF, 6-digit D value display.
Wide dielectric constant range: ε = 1–10⁵.
Performance of ε and D
Frequency range (solid insulation materials): 20 Hz – 2 MHz
Measurement range:
Dielectric constant (ε): 1–10⁵
Dissipation factor (D): 0.1 – 0.00005
Accuracy (at 10 kHz):
ε: ±2%
D: ±5% ±0.0001
Parameter | Specification |
---|---|
Measured Parameters | C, L, R, Z, Y, X, B, G, D, Q, θ, DCR |
Frequency Range | 20 Hz – 2 MHz, 10 mHz step |
Test Signal Voltage | ≤1 MHz: 10 mV–5 V ±(10%+10 mV); >1 MHz: 10 mV–1 V ±(20%+10 mV) |
Output Impedance | 10Ω, 30Ω, 50Ω, 100Ω |
Basic Accuracy | 0.1% |
Capacitance Range | 0.00001 pF – 9.99999 F |
Resistance Range | 0.0001 Ω – 99.999 MΩ |
Conductance / Susceptance | 0.0001 nS – 99.999 S |
Dissipation Factor (D) | 0.00001 – 9.99999 |
Q Factor Range | 0.0001 – 99999 |
Phase Angle (θ) | -179.99° – 179.99° |
Measurement Speed | Fast: 200 times/s (>30 kHz), 100 times/s (>1 kHz); Medium: 25 times/s; Slow: 5 times/s |
Calibration Functions | Open/short/load calibration, spot frequency and sweep calibration |
Equivalent Circuit Modes | Series, Parallel |
Trigger Modes | Internal, Manual, External, Bus |
Built-in DC Bias Source | Voltage: -5 V ~ +5 V (1 mV step); Current: -100 mA ~ +100 mA (20 μA step, 50Ω internal resistance) |
Comparator Function | 10-bin sorting & counting |
Display | 320×240 graphical LCD |
Memory | 20 groups of settings, USB external storage |
Interfaces | RS232C, USB, LAN, HANDLER, GPIB (optional) |
Dielectric Test Fixture | Precision parallel-plate electrodes (Φ10–56 mm sample diameter, thickness <10 mm); Supports contact, thin-film, and non-contact modes |
Resolution (Micrometer) | 10 μm |
Maximum Withstand Voltage | ±42 Vp (AC+DC) |
Cable Length | 1 m |
Max Test Frequency | 5 MHz |
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